Direct Surface Tension Measurements of Individual Sub-Micrometer Particles Using Atomic Force Microscopy.

Lee, Hansol D; Estillore, Armando D; Morris, Holly S; Ray, Kamal K; Alejandro, Aldair; Grassian, Vicki H; Tivanski, Alexei V

Lee, Hansol D; Estillore, Armando D; Morris, Holly S; Ray, Kamal K; Alejandro, Aldair; Grassian, Vicki H; Tivanski, Alexei V.

Afiliação

Lee HD; Department of Chemistry, University of Iowa , Iowa City, Iowa 52242, United States.
Morris HS; Department of Chemistry, University of Iowa , Iowa City, Iowa 52242, United States.
Ray KK; Department of Chemistry, University of Iowa , Iowa City, Iowa 52242, United States.
Alejandro A; Department of Chemistry, University of Iowa , Iowa City, Iowa 52242, United States.
Tivanski AV; Department of Chemistry, University of Iowa , Iowa City, Iowa 52242, United States.

J Phys Chem A ; 121(43): 8296-8305, 2017 Nov 02.

Article em En | MEDLINE | ID: mdl-28981283

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Phys Chem A Assunto da revista: QUIMICA Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Estados Unidos

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