Long-lived transient anion of c-C4F8O.
J Chem Phys
; 148(7): 074303, 2018 Feb 21.
Article
em En
| MEDLINE
| ID: mdl-29471655
ABSTRACT
We report partial cross sections for electron attachment to c-C4F8O, a gas with promising technological applications in free-electron-rich environments. The dissociative electron attachment leads to a number of anionic fragments resulting from complex bond-breaking and bond-forming processes. However, the anion with the highest abundance is the non-dissociated (transient) parent anion which is formed around 0.9 eV electron energy. Its lifetime reaches tens of microseconds. We discuss the origin of this long lifetime, the anion's strong interactions with other molecules, and the consequences for electron-scavenging properties of c-C4F8O in denser environments, in particular for its use in mixtures with CO2 and N2.
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1
Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
J Chem Phys
Ano de publicação:
2018
Tipo de documento:
Article
País de afiliação:
República Tcheca