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Examining epitaxial graphene surface conductivity and quantum Hall device stability with Parylene passivation.
Rigosi, Albert F; Liu, Chieh-I; Wu, Bi Yi; Lee, Hsin-Yen; Kruskopf, Mattias; Yang, Yanfei; Hill, Heather M; Hu, Jiuning; Bittle, Emily G; Obrzut, Jan; Hight Walker, Angela R; Elmquist, Randolph E; Newell, David B.
Afiliação
  • Rigosi AF; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Liu CI; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Wu BY; Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan.
  • Lee HY; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Kruskopf M; Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan.
  • Yang Y; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Hill HM; Theiss Research, La Jolla, CA 92037, United States.
  • Hu J; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Bittle EG; Joint Quantum Institute, University of Maryland, College Park, MD 20742, United States.
  • Obrzut J; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Hight Walker AR; Joint Quantum Institute, University of Maryland, College Park, MD 20742, United States.
  • Elmquist RE; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Newell DB; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
Microelectron Eng ; 194: 51-55, 2018 Jul.
Article em En | MEDLINE | ID: mdl-29881131
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microelectron Eng Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microelectron Eng Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Estados Unidos