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A brief prehistory of double descent.
Loog, Marco; Viering, Tom; Mey, Alexander; Krijthe, Jesse H; Tax, David M J.
Afiliação
  • Loog M; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands; m.loog@tudelft.nl.
  • Viering T; Department of Computer Science, University of Copenhagen, 1165 Copenhagen, Denmark.
  • Mey A; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands.
  • Krijthe JH; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands.
  • Tax DMJ; Pattern Recognition Laboratory, Delft University of Technology, 2628 CD Delft, The Netherlands.
Proc Natl Acad Sci U S A ; 117(20): 10625-10626, 2020 05 19.
Article em En | MEDLINE | ID: mdl-32371495
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Proc Natl Acad Sci U S A Ano de publicação: 2020 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Proc Natl Acad Sci U S A Ano de publicação: 2020 Tipo de documento: Article