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Analytical determination of atypical quantized resistances in graphene p-n junctions.
Rigosi, Albert F; Marzano, Martina; Levy, Antonio; Hill, Heather M; Patel, Dinesh K; Kruskopf, Mattias; Jin, Hanbyul; Elmquist, Randolph E; Newell, David B.
Afiliação
  • Rigosi AF; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Marzano M; Department of Electronics and Telecommunications, Politecnico di Torino, Torino 10129, Italy.
  • Levy A; Istituto Nazionale di Ricerca Metrologica, Torino 10135, Italy.
  • Hill HM; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Patel DK; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Kruskopf M; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Jin H; Department of Physics, National Taiwan University, Taipei 10617, Taiwan.
  • Elmquist RE; Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
  • Newell DB; Joint Quantum Institute, University of Maryland, College Park, MD 20742, United States.
Physica B Condens Matter ; 5822020.
Article em En | MEDLINE | ID: mdl-32863578
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Physica B Condens Matter Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Physica B Condens Matter Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Estados Unidos