Dielectric Properties of NbxW1-xSe2 Alloys.

Rigosi, Albert F; Hill, Heather M; Krylyuk, Sergiy; Nguyen, Nhan V; Hight Walker, Angela R; Davydov, Albert V; Newell, David B

Dielectric Properties of Nb_xW_1-xSe₂ Alloys.

Rigosi, Albert F; Hill, Heather M; Krylyuk, Sergiy; Nguyen, Nhan V; Hight Walker, Angela R; Davydov, Albert V; Newell, David B.

Afiliação

Rigosi AF; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Hill HM; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Krylyuk S; Theiss Research, La Jolla, CA 92037, USA.
Nguyen NV; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Hight Walker AR; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Davydov AV; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Newell DB; National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

J Res Natl Inst Stand Technol ; 124: 1-10, 2019.

Article em En | MEDLINE | ID: mdl-34877178

Palavras-chave

Raman spectroscopy; ellipsometry; transition metal dichalcogenides

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Res Natl Inst Stand Technol Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Estados Unidos

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