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Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X-ray reflectivity.
Modi, Mohammed H; Gupta, Shruti; Yadav, Praveen K; Gupta, Rajkumar; Bose, Aniruddha; Mukherjee, Chandrachur; Jonnard, Philippe; Idir, Mourad.
Afiliação
  • Modi MH; Soft X-ray Applications Laboratory, Raja Ramanna Centre for Advanced Technology, Indore 452013, India.
  • Gupta S; Soft X-ray Applications Laboratory, Raja Ramanna Centre for Advanced Technology, Indore 452013, India.
  • Yadav PK; Soft X-ray Applications Laboratory, Raja Ramanna Centre for Advanced Technology, Indore 452013, India.
  • Gupta R; Soft X-ray Applications Laboratory, Raja Ramanna Centre for Advanced Technology, Indore 452013, India.
  • Bose A; Superconducting Proton Linac Section, Raja Ramanna Centre for Advanced Technology, Indore 452013, India.
  • Mukherjee C; Optical Coating Laboratory, Raja Ramanna Centre for Advanced Technology, Indore 452013, India.
  • Jonnard P; Sorbonne Universite, Faculte des Sciences et Ingénierie, UMR CNRS, Laboratoire de Chimie Physique-Matiere et Rayonnement, 4 Place Jussieu, F-75252 Paris Cedex 05, France.
  • Idir M; National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, PO Box 5000, Upton, NY 11973, USA.
J Synchrotron Radiat ; 29(Pt 4): 978-984, 2022 Jul 01.
Article em En | MEDLINE | ID: mdl-35787563
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Índia
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Índia