Damage protection from focused ion beam process toward nanocavity-implemented compound semiconductor nanowire lasers.

Takiguchi, Masato; Zhang, Guoqiang; Sasaki, Satoshi; Tateno, Kouta; John, Caleb; Ono, Masaaki; Sumikura, Hisashi; Shinya, Akihiko; Notomi, Masaya

Takiguchi, Masato; Zhang, Guoqiang; Sasaki, Satoshi; Tateno, Kouta; John, Caleb; Ono, Masaaki; Sumikura, Hisashi; Shinya, Akihiko; Notomi, Masaya.

Afiliação

Takiguchi M; Nanophotonics Center, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
Zhang G; NTT Basic Research Laboratories, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
Sasaki S; Nanophotonics Center, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
Tateno K; NTT Basic Research Laboratories, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
John C; NTT Basic Research Laboratories, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
Ono M; Nanophotonics Center, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
Sumikura H; NTT Basic Research Laboratories, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
Shinya A; NTT Basic Research Laboratories, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.
Notomi M; Nanophotonics Center, NTT Corp., 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan.

Nanotechnology ; 34(13)2023 Jan 20.

Article em En | MEDLINE | ID: mdl-36608329

Palavras-chave

focused ion beam; laser; nanowire; photoluminescence; time-resolved spectroscopy

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Japão

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