Controlling tetragonality and crystalline orientation in BaTiO3 nano-layers grown on Si.

A hybrid growth process was developed in order to epitaxially integrate nano-layers of the multi-functional perovskite BaTiO3 onto Si(001) substrates. In particular, we combined molecular beam epitaxy (MBE) with radio-frequency sputtering. Due to its strong influence on the functional properties, the crystalline structure of the layers was thoroughly investigated throughout our study. MBE-grown seed layers are tetragonal and c-axis oriented up to a thickness of 20 nm. A transition into a-axis films is visible for thicker layers. When the seed layer thickness exceeds 6 nm, subsequently sputtered BaTiO3 films are epitaxial. However, their crystalline structure, their orientation with respect to the substrate, and their morphology are strongly dependent on the deposition and post-deposition thermal budget. Consistently with their crystalline symmetry, thin MBE BaTiO3 films are piezo- and ferroelectric with a spontaneous polarization perpendicular to the surface. Also for thick films, the functional response, as determined via piezo-force microscopy, is in good agreement with the structural properties.

Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins

The arrangement of spins at interfaces in a layered magnetic material often has an important effect on the properties of the material. One example of this is the directional coupling between the spins in an antiferromagnet and those in an adjacent ferromagnet, an effect first discovered in 1956 and referred to as exchange bias. Because of its technological importance for the development of advanced devices such as magnetic read heads and magnetic memory cells, this phenomenon has received much attention. Despite extensive studies, however, exchange bias is still poorly understood, largely due to the lack of techniques capable of providing detailed information about the arrangement of magnetic moments near interfaces. Here we present polarization-dependent X-ray magnetic dichroism spectro-microscopy that reveals the micromagnetic structure on both sides of a ferromagnetic-antiferromagnetic interface. Images of thin ferromagnetic Co films grown on antiferromagnetic LaFeO3 show a direct link between the arrangement of spins in each material. Remanent hysteresis loops, recorded for individual ferromagnetic domains, show a local exchange bias. Our results imply that the alignment of the ferromagnetic spins is determined, domain by domain, by the spin directions in the underlying antiferromagnetic layer.

Antiferromagnetic LaFeO(3) thin films and their effect on exchange bias.

Antiferromagnetic (AFM) orthoferrites are interesting model systems for exploring the correlation between their crystalline and AFM domains and the resulting exchange bias when coupled to a ferromagnetic layer. In particular, LaFeO(3) (LFO) has a Néel temperature, T(N) = 740 K, which is the highest in the orthoferrite family. The recent developments of synchrotron radiation-based photoelectron emission microscopy (PEEM) have provided the possibility of studying AFM domain structures as well as the magnetic coupling between the AFM and the adjacent ferromagnetic (FM) layer, domain by domain. Thin films of LFO have proved excellent candidates for such studies because their AFM domains are well defined and large enough to be readily imaged by PEEM. This paper reviews the growth, structural and magnetic properties of LFO thin films as well as exchange coupling to a FM layer. The strong correlation between structural and AFM domains in this material allows us to investigate the exchange coupling as a function of the domain configuration, which can be changed by using different substrate material and substrate orientation. A significant increase of the exchange bias field by a factor of about 10 was obtained when LFO was diluted with Ni atoms in the volume part. In this sample, the structural domain boundary became corrugated due to substitutional defects. Our results indicate that the details of the precise domain boundary configuration strongly affect the exchange coupling.

Electrostatic modulation of the superfluid density in an ultrathin film.

By capacitively charging an underdoped ultrathin La2-xSrxCuO4 film with an electric field applied across a gate insulator with a high dielectric constant, relative changes of the areal superfluid density ns of unprecedented strength were observed in measurements of the film kinetic inductance. Although ns appears to be substantially reduced by disorder, the data provide, for the first time on the same sample, direct compelling evidence for the Uemura relation Tc proportional to ns(T=0) in the underdoped regime of copper-oxide superconductors.

Observation of antiferromagnetic domains in epitaxial thin films

Antiferromagnetic domains in an epitaxial thin film, LaFeO(3) on SrTiO(3)(100), were observed using a high-spatial-resolution photoelectron emission microscope with contrast generated by the large x-ray magnetic linear dichroism effect at the multiplet-split L edge of Fe. The antiferromagnetic domains are linked to 90 degrees twinned crystallographic regions in the film. The Neel temperature of the thin film is reduced by 70 kelvin relative to the bulk material, and this reduction is attributed to epitaxial strain. These studies open the door for a microscopic understanding of the magnetic coupling across antiferromagnetic-ferromagnetic interfaces.

Studies of the magnetic structure at the ferromagnet-antiferromagnet interface.

Antiferromagnetic layers are a scientifically challenging component in magnetoelectronic devices, such as magnetic sensors in hard-disk heads, or magnetic random-access memory (RAM) elements. In this paper, it is shown that photoelectron emission microscopy (PEEM) is capable of determining the magnetic structure at the interface of ferromagnets and antiferromagnets with high spatial resolution (down to 20 nm). Dichroism effects at the L edges of the magnetic 3d transition metals, using circularly or linearly polarized soft X-rays from a synchrotron source, give rise to a magnetic image contrast. Images, acquired with the PEEM2 experiment at the Advanced Light Source, show magnetic contrast for antiferromagnetic LaFeO3, microscopically resolving the magnetic domain structure in an antiferromagnetically ordered thin film for the first time. Magnetic coupling between LaFeO3 and an adjacent Co layer results in a complete correlation of their magnetic domain structures. From field-dependent measurements, a unidirectional anisotropy resulting in a local exchange bias of up to 30 Oe in single domains could be deduced. The elemental specificity and the quantitative magnetic sensitivity render PEEM a perfect tool to study magnetic coupling effects in multilayered thin-film samples.