RESUMEN
We present a new quantitative x-ray phase-contrast imaging method based on the edge illumination principle, which allows achieving unprecedented nanoradian sensitivity. The extremely high angular resolution is demonstrated theoretically and through experimental images obtained at two different synchrotron radiation facilities. The results, achieved at both very high and very low x-ray energies, show that this highly sensitive technique can be efficiently exploited over a very broad range of experimental conditions. This method can open the way to new, previously inaccessible scientific applications in various fields including biology, medicine and materials science.
Asunto(s)
Modelos Teóricos , Tomografía Computarizada por Rayos X/instrumentación , Tomografía Computarizada por Rayos X/métodos , Polipropilenos/químicaRESUMEN
The molecular-frame angular distributions of resonantly excited CO:C(1s) --> pi* Auger electrons were determined using angle-resolved electron-ion coincidence spectroscopy in combination with a novel transformation procedure. Our new methodology yields full three-dimensional electron angular distributions with high energy resolution from the measurement of electrons at only two angles. The experimentally determined distributions are well reproduced by calculations performed in a simple one-center approximation, allowing an unambiguous identification of several overlapping Auger lines.