Electro-Optical Sampling of Single-Cycle THz Fields with Single-Photon Detectors.

Electro-optical sampling of Terahertz fields with ultrashort pulsed probes is a well-established approach for directly measuring the electric field of THz radiation. This technique usually relies on balanced detection to record the optical phase shift brought by THz-induced birefringence. The sensitivity of electro-optical sampling is, therefore, limited by the shot noise of the probe pulse, and improvements could be achieved using quantum metrology approaches using, e.g., NOON states for Heisenberg-limited phase estimation. We report on our experiments on THz electro-optical sampling using single-photon detectors and a weak squeezed vacuum field as the optical probe. Our approach achieves field sensitivity limited by the probe state statistical properties using phase-locked single-photon detectors and paves the way for further studies targeting quantum-enhanced THz sensing.

Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy.

Scanning thermal microscopy (SThM) is a technique which is often used for the measurement of the thermal conductivity of materials at the nanometre scale. The impact of nano-scale feature size and shape on apparent thermal conductivity, as measured using SThM, has been investigated. To achieve this, our recently developed topography-free samples with 200 and 400 nm wide gold wires (50 nm thick) of length of 400-2500 nm were fabricated and their thermal resistance measured and analysed. This data was used in the development and validation of a rigorous but simple heat transfer model that describes a nanoscopic contact to an object with finite shape and size. This model, in combination with a recently proposed thermal resistance network, was then used to calculate the SThM probe signal obtained by measuring these features. These calculated values closely matched the experimental results obtained from the topography-free sample. By using the model to analyse the dimensional dependence of thermal resistance, we demonstrate that feature size and shape has a significant impact on measured thermal properties that can result in a misinterpretation of material thermal conductivity. In the case of a gold nanowire embedded within a silicon nitride matrix it is found that the apparent thermal conductivity of the wire appears to be depressed by a factor of twenty from the true value. These results clearly demonstrate the importance of knowing both probe-sample thermal interactions and feature dimensions as well as shape when using SThM to quantify material thermal properties. Finally, the new model is used to identify the heat flux sensitivity, as well as the effective contact size of the conventional SThM system used in this study.

Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size.

We report a method for quantifying scanning thermal microscopy (SThM) probe-sample thermal interactions in air using a novel temperature calibration device. This new device has been designed, fabricated and characterised using SThM to provide an accurate and spatially variable temperature distribution that can be used as a temperature reference due to its unique design. The device was characterised by means of a microfabricated SThM probe operating in passive mode. This data was interpreted using a heat transfer model, built to describe the thermal interactions during a SThM thermal scan. This permitted the thermal contact resistance between the SThM tip and the device to be determined as 8.33 × 10(5) K W(-1). It also permitted the probe-sample contact radius to be clarified as being the same size as the probe's tip radius of curvature. Finally, the data were used in the construction of a lumped-system steady state model for the SThM probe and its potential applications were addressed.

Aperiodic interferometer for six degrees of freedom position measurement.

We present a new class of interferometer system that is capable of simultaneous measurement of absolute position and rotation in all six degrees of freedom (DOF) with nanometer precision. This novel capability is due to the employment of a system of interference fringes that is not periodic. One of the key strengths offered by this new approach is that the absolute position of the system can be determined with a single measurement, rather than by counting fringes during displacement from a known location. The availability of a simultaneous measurement of all six DOF eliminates many problems associated with conventional interferometry.