Study on the reflectivity properties of spherically bent analyser crystals.

Honkanen, Ari-Pekka; Verbeni, Roberto; Simonelli, Laura; Moretti Sala, Marco; Monaco, Giulio; Huotari, Simo

Honkanen, Ari-Pekka; Verbeni, Roberto; Simonelli, Laura; Moretti Sala, Marco; Monaco, Giulio; Huotari, Simo.

Afiliación

Honkanen AP; Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.
Verbeni R; European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
Simonelli L; European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
Moretti Sala M; European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
Monaco G; European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble Cedex, France.
Huotari S; Department of Physics, PO Box 64, FI-00014 Helsinki, Finland.

J Synchrotron Radiat ; 21(Pt 1): 104-10, 2014 Jan.

Article en En | MEDLINE | ID: mdl-24365923

Palabras clave

bent crystals; high-energy-resolution analysers; inelastic X-ray scattering

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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: J Synchrotron Radiat Asunto de la revista: RADIOLOGIA Año: 2014 Tipo del documento: Article País de afiliación: Finlandia

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