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Measurement of 100 nm and 60 nm Particle Standards by Differential Mobility Analysis.
Mulholland, George W; Donnelly, Michelle K; Hagwood, Charles R; Kukuck, Scott R; Hackley, Vincent A; Pui, David Y H.
Afiliación
  • Mulholland GW; National Institute of Standards and Technology, Gaithersburg, MD 20899.
  • Donnelly MK; National Institute of Standards and Technology, Gaithersburg, MD 20899.
  • Hagwood CR; National Institute of Standards and Technology, Gaithersburg, MD 20899.
  • Kukuck SR; National Institute of Standards and Technology, Gaithersburg, MD 20899.
  • Hackley VA; National Institute of Standards and Technology, Gaithersburg, MD 20899.
  • Pui DY; Department of Mechanical Engineering, Particle Technology Laboratory, University of Minnesota, Minneapolis, MN 55455.
J Res Natl Inst Stand Technol ; 111(4): 257-312, 2006.
Article en En | MEDLINE | ID: mdl-27274934
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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: J Res Natl Inst Stand Technol Año: 2006 Tipo del documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: J Res Natl Inst Stand Technol Año: 2006 Tipo del documento: Article