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Observation of electron beam moiré fringes in an image conversion tube.
Lei, Yunfei; Liao, Yubo; Long, Jing-Hua; Cai, Houzhi; Bai, Yanli; Liu, Jinyuan.
Afiliación
  • Lei Y; Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education, Shenzhen University, Shenzhen 518060, China.
  • Liao Y; Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education, Shenzhen University, Shenzhen 518060, China.
  • Long JH; College of Physics Science and Technology, Shenzhen University, Shenzhen 518060, China.
  • Cai H; Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education, Shenzhen University, Shenzhen 518060, China.
  • Bai Y; Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education, Shenzhen University, Shenzhen 518060, China.
  • Liu J; Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education, Shenzhen University, Shenzhen 518060, China. Electronic address: ljy@szu.edu.cn.
Ultramicroscopy ; 170: 19-23, 2016 11.
Article en En | MEDLINE | ID: mdl-27522476
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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2016 Tipo del documento: Article País de afiliación: China
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2016 Tipo del documento: Article País de afiliación: China