Optical thickness identification of transition metal dichalcogenide nanosheets on transparent substrates.

Zhang, Hao; Ran, Feirong; Shi, Xiaotong; Fang, Xiangru; Wu, Shiyu; Liu, Yue; Zheng, Xianqiang; Yang, Peng; Liu, Yang; Wang, Lin; Huang, Xiao; Li, Hai; Huang, Wei

Zhang, Hao; Ran, Feirong; Shi, Xiaotong; Fang, Xiangru; Wu, Shiyu; Liu, Yue; Zheng, Xianqiang; Yang, Peng; Liu, Yang; Wang, Lin; Huang, Xiao; Li, Hai; Huang, Wei.

Afiliación

Zhang H; Key Laboratory of Flexible Electronics (KLOFE) & Institute of Advanced Materials (IAM), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing Tech University (NanjingTech), 30 South Puzhu Road, Nanjing 211816, People's Republic of China.

Nanotechnology ; 28(16): 164001, 2017 Apr 21.

Article en En | MEDLINE | ID: mdl-28327463

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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Nanotechnology Año: 2017 Tipo del documento: Article

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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Nanotechnology Año: 2017 Tipo del documento: Article