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Rapid and Accurate C-V Measurements.
Kim, Ji-Hong; Shrestha, Pragya R; Campbell, Jason P; Ryan, Jason T; Nminibapiel, David; Kopanski, Joseph J; Cheung, Kin P.
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  • Kim JH; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Shrestha PR; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, and also with the Department of Electrical and Computer Engineering, Old Dominion University, Norfolk, VA 23529, USA.
  • Campbell JP; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Ryan JT; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Nminibapiel D; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, and also with the Department of Electrical and Computer Engineering, Old Dominion University, Norfolk, VA 23529, USA.
  • Kopanski JJ; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Cheung KP; Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
IEEE Trans Electron Devices ; 63(10): 3851-3856, 2016 Oct.
Article en En | MEDLINE | ID: mdl-28579633
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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: IEEE Trans Electron Devices Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: IEEE Trans Electron Devices Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos