An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field.

Jones, L; Varambhia, A; Sawada, H; Nellist, P D

Jones, L; Varambhia, A; Sawada, H; Nellist, P D.

Afiliación

Jones L; School of Physics, Trinity College Dublin, Dublin 2, Ireland.
Varambhia A; Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin 2, Ireland.
Sawada H; Department of Materials, University of Oxford, Oxford, U.K.
Nellist PD; JEOL Ltd, Musashino, Akishima, Tokyo.

J Microsc ; 270(2): 176-187, 2018 05.

Article en En | MEDLINE | ID: mdl-29315554

Palabras clave

ADF-STEM; EELS; detector angle calibration; detector sensitivity measurement; quantitative STEM

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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: J Microsc Año: 2018 Tipo del documento: Article País de afiliación: Irlanda

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