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Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors.
Chen, Hong-Chih; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Guan-Fu; Chen, Bo-Wei; Hung, Yu-Ju; Chang, Kuo-Jui; Cheng, Kai-Chung; Huang, Chen-Shuo; Chen, Kuo-Kuang; Lu, Hsueh-Hsing; Lin, Yu-Hsin.
Afiliación
  • Chen HC; Department of Photonics , National Cheng Kung University , Tainan 701 , Taiwan R. O. C.
  • Lai WC; Department of Photonics , National Cheng Kung University , Tainan 701 , Taiwan R. O. C.
  • Chang KJ; New Display Process Research Division , AU Optronics Corporation , Hsinchu 300 , Taiwan R. O. C.
  • Cheng KC; New Display Process Research Division , AU Optronics Corporation , Hsinchu 300 , Taiwan R. O. C.
  • Huang CS; New Display Process Research Division , AU Optronics Corporation , Hsinchu 300 , Taiwan R. O. C.
  • Chen KK; New Display Process Research Division , AU Optronics Corporation , Hsinchu 300 , Taiwan R. O. C.
  • Lu HH; New Display Process Research Division , AU Optronics Corporation , Hsinchu 300 , Taiwan R. O. C.
  • Lin YH; New Display Process Research Division , AU Optronics Corporation , Hsinchu 300 , Taiwan R. O. C.
ACS Appl Mater Interfaces ; 10(31): 25866-25870, 2018 Aug 08.
Article en En | MEDLINE | ID: mdl-29481039

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2018 Tipo del documento: Article

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2018 Tipo del documento: Article