Variability and origins of grain boundary electric potential detected by electron holography and atom-probe tomography.

Xu, Xin; Liu, Yuzi; Wang, Jie; Isheim, Dieter; Dravid, Vinayak P; Phatak, Charudatta; Haile, Sossina M

Xu, Xin; Liu, Yuzi; Wang, Jie; Isheim, Dieter; Dravid, Vinayak P; Phatak, Charudatta; Haile, Sossina M.

Afiliación

Xu X; Program of Applied Physics, Northwestern University, Evanston, IL, USA.
Liu Y; Center for Nanoscale Materials, Argonne National Laboratory, Lemont, IL, USA.
Wang J; Center for Nanoscale Materials, Argonne National Laboratory, Lemont, IL, USA.
Isheim D; Department of Materials Science & Engineering, Northwestern University, Evanston, IL, USA.
Dravid VP; Program of Applied Physics, Northwestern University, Evanston, IL, USA.
Phatak C; Department of Materials Science & Engineering, Northwestern University, Evanston, IL, USA.
Haile SM; Materials Science Division, Argonne National Laboratory, Lemont, IL, USA.

Nat Mater ; 19(8): 887-893, 2020 Aug.

Article en En | MEDLINE | ID: mdl-32284599

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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Nat Mater Asunto de la revista: CIENCIA / QUIMICA Año: 2020 Tipo del documento: Article País de afiliación: Estados Unidos

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