Truncated Nonlinear Interferometry for Quantum-Enhanced Atomic Force Microscopy.

Pooser, R C; Savino, N; Batson, E; Beckey, J L; Garcia, J; Lawrie, B J

Pooser, R C; Savino, N; Batson, E; Beckey, J L; Garcia, J; Lawrie, B J.

Afiliación

Pooser RC; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Savino N; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Batson E; Department of Physics and Engineering Physics, Tulane University, New Orleans, Louisiana 70118, USA.
Beckey JL; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Garcia J; Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
Lawrie BJ; Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.

Phys Rev Lett ; 124(23): 230504, 2020 Jun 12.

Article en En | MEDLINE | ID: mdl-32603167

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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2020 Tipo del documento: Article País de afiliación: Estados Unidos

Texto completo

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2020 Tipo del documento: Article País de afiliación: Estados Unidos