Joint analysis of structural connectivity and cortical surface features: correlates with mild traumatic brain injury.

Kerley, Cailey I; Cai, Leon Y; Yu, Chang; Crawford, Logan M; Elenberger, Jason M; Singh, Eden S; Schilling, Kurt G; Aboud, Katherine S; Landman, Bennett A; Rex, Tonia S

Kerley, Cailey I; Cai, Leon Y; Yu, Chang; Crawford, Logan M; Elenberger, Jason M; Singh, Eden S; Schilling, Kurt G; Aboud, Katherine S; Landman, Bennett A; Rex, Tonia S.

Afiliación

Kerley CI; Department of Electrical Engineering, Vanderbilt University.
Cai LY; Department of Biomedical Engineering, Vanderbilt University.
Yu C; Department of Computer Science, Vanderbilt University.
Crawford LM; Department of Ophthalmology and Visual Sciences, Vanderbilt University Medical Center.
Elenberger JM; Department of Ophthalmology and Visual Sciences, Vanderbilt University Medical Center.
Singh ES; Department of Ophthalmology and Visual Sciences, Vanderbilt University Medical Center.
Schilling KG; Vanderbilt University Institute of Imaging Science, Vanderbilt University.
Aboud KS; Vanderbilt Brain Institute, Vanderbilt University.
Landman BA; Department of Electrical Engineering, Vanderbilt University.
Rex TS; Department of Biomedical Engineering, Vanderbilt University.