Reprint of: Automated geometric aberration correction for large-angle illumination STEM.

Ishikawa, Ryo; Tanaka, Riku; Morishita, Shigeyuki; Kohno, Yuji; Sawada, Hidetaka; Sasaki, Takuya; Ichikawa, Masanari; Hasegawa, Masashi; Shibata, Naoya; Ikuhara, Yuichi

Ishikawa, Ryo; Tanaka, Riku; Morishita, Shigeyuki; Kohno, Yuji; Sawada, Hidetaka; Sasaki, Takuya; Ichikawa, Masanari; Hasegawa, Masashi; Shibata, Naoya; Ikuhara, Yuichi.

Afiliación

Ishikawa R; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan; PRESTO, Japan Science and Technology Agency, Kawaguchi, Saitama 332-0012, Japan. Electronic address: ishikawa@sigma.t.u-tokyo.ac.jp.
Tanaka R; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan.
Morishita S; JEOL Ltd, 3-1-2, Akishima, Tokyo 196-8558, Japan.
Kohno Y; JEOL Ltd, 3-1-2, Akishima, Tokyo 196-8558, Japan.
Sawada H; JEOL Ltd, 3-1-2, Akishima, Tokyo 196-8558, Japan.
Sasaki T; Department of Materials Physics, Nagoya University, Nagoya, Aichi 464-8603, Japan.
Ichikawa M; Department of Materials Physics, Nagoya University, Nagoya, Aichi 464-8603, Japan.
Hasegawa M; Department of Materials Physics, Nagoya University, Nagoya, Aichi 464-8603, Japan.
Shibata N; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan; Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Aichi 456-8587, Japan.
Ikuhara Y; Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, 113-8656, Japan; Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Aichi 456-8587, Japan.

Ultramicroscopy ; 231: 113410, 2021 Dec.

Article en En | MEDLINE | ID: mdl-34756616

Palabras clave

Annular dark-field (ADF); Differential phase-contrast (DPC); depth sectioning; geometric aberration correction; scanning transmission electron microscopy (STEM)

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