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Subsurface phase imaging of tapping-mode atomic force microscopy at phase resonance.
Sun, Baishun; Cao, Liang; Xie, Chenchen; Lu, Zhengcheng; Liu, Mengnan; Yu, Miao; Song, Zhengxun; Wen, Zhankun; Wang, Zuobin.
Afiliación
  • Sun B; International Research Centre for Nano Handling and Manufacturing of China, Changchun University of Science and Technology, Changchun, China.
  • Cao L; College of Medical Engineering, Jilin Medical University, Jilin, China.
  • Xie C; Ministry of Education Key Laboratory for Cross-Scale Micro and Nano Manufacturing, Changchun University of Science and Technology, Changchun, China.
  • Lu Z; International Research Centre for Nano Handling and Manufacturing of China, Changchun University of Science and Technology, Changchun, China.
  • Liu M; Ministry of Education Key Laboratory for Cross-Scale Micro and Nano Manufacturing, Changchun University of Science and Technology, Changchun, China.
  • Yu M; International Research Centre for Nano Handling and Manufacturing of China, Changchun University of Science and Technology, Changchun, China.
  • Song Z; Ministry of Education Key Laboratory for Cross-Scale Micro and Nano Manufacturing, Changchun University of Science and Technology, Changchun, China.
  • Wen Z; IRAC & JR3CN, University of Bedfordshire, Luton, UK.
  • Wang Z; International Research Centre for Nano Handling and Manufacturing of China, Changchun University of Science and Technology, Changchun, China.
J Microsc ; 287(3): 148-155, 2022 09.
Article en En | MEDLINE | ID: mdl-35789488

Texto completo: 1 Bases de datos: MEDLINE Asunto principal: Vibración Idioma: En Revista: J Microsc Año: 2022 Tipo del documento: Article País de afiliación: China

Texto completo: 1 Bases de datos: MEDLINE Asunto principal: Vibración Idioma: En Revista: J Microsc Año: 2022 Tipo del documento: Article País de afiliación: China