Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques.

Kim, Somi; Yoo, Hochen; Choi, Jaeyoung

Kim, Somi; Yoo, Hochen; Choi, Jaeyoung.

Afiliación

Kim S; Department of Electronic Engineering, Gachon University, Seongnam-si 13120, Republic of Korea.
Yoo H; Department of Electronic Engineering, Gachon University, Seongnam-si 13120, Republic of Korea.
Choi J; School of Computing, Gachon University, Seongnam-si 13120, Republic of Korea.

Sensors (Basel) ; 23(4)2023 Feb 17.

Article en En | MEDLINE | ID: mdl-36850862

Palabras clave

causal inference; charge trapping; data analysis; hysteresis; organic semiconductors

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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article

Texto completo

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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article