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Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection.
Roccapriore, Kevin M; Ziatdinov, Maxim; Torsi, Riccardo; Robinson, Joshua; Kalinin, Sergei V.
Afiliación
  • Roccapriore KM; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States.
  • Ziatdinov M; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States.
  • Torsi R; Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States.
  • Robinson J; Materials Science and Engineering, Penn State University, University Park, PA, United States.
  • Kalinin SV; Materials Science and Engineering, Penn State University, University Park, PA, United States.
Microsc Microanal ; 29(Supplement_1): 392-393, 2023 Jul 22.
Article en En | MEDLINE | ID: mdl-37613074
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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos