Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry to Depth Profile Nanoparticles in Polymer Nanocomposites.

Zhang, Aria C; Maguire, Shawn M; Ford, Jamie T; Composto, Russell J

Zhang, Aria C; Maguire, Shawn M; Ford, Jamie T; Composto, Russell J.

Afiliación

Zhang AC; Materials Science and Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104, USA.
Maguire SM; Materials Research Science & Engineering Center (MRSEC), University of Pennsylvania, 3231 Walnut Street, Philadelphia 19104, USA.
Ford JT; Materials Science and Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104, USA.
Composto RJ; Nanoscale Characterization Facility, University of Pennsylvania, 3205 Walnut Street, Philadelphia, Pennsylvania 19104, USA.

Microsc Microanal ; 29(5): 1557-1565, 2023 Sep 29.

Article en En | MEDLINE | ID: mdl-37639375

Palabras clave

depth profiles; diffusion; polymer nanocomposites; surface and interface; time-of-flight secondary ion mass spectrometry

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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos

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