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1.
Anal Chem ; 93(10): 4463-4471, 2021 03 16.
Artigo em Inglês | MEDLINE | ID: mdl-33661602

RESUMO

The two paintings Infant Bacchanals (Museo Nazionale d'Arte Antica, Palazzo Barberini, Rome, Italy) executed by Nicolas Poussin (Les Andelys, 1594-Rome, 1665) in around 1626 are thought to have been painted "a guazzo", which means either with a glue or with an egg binding medium. To date, this has never been confirmed through analysis. Dual-beam time-of-flight secondary ion mass spectrometry (TOF-SIMS), using a bismuth cluster liquid metal ion gun and an argon gas cluster ion beam, allows the mapping of organic and inorganic matter on paintings cross sections, with the possibility to acquire submicrometer-resolution mass spectrometry images of the sample, together with high mass resolution using a delayed extraction of secondary ions. The surfaces of cross sections from both paintings were prepared beforehand either by polishing or by microtome cutting and then cleaned with the gas cluster ion beam directly inside the vacuum chamber of the instrument. The nature of the binders in the two paintings was investigated by TOF-SIMS analyses. By considering the uneven physical properties of the heterogeneous analyzed surfaces, several high-resolution images were recorded with different instrument settings. The detection of lipids seems to point toward an oil-containing medium, rather than a glue-binding medium. An emulsion made of oil and glue is another hypothesis to be explored to better understand the artist's working methods in his early career.

2.
J Mass Spectrom ; 57(1): e4803, 2022 Jan.
Artigo em Inglês | MEDLINE | ID: mdl-34997666

RESUMO

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging is a surface analysis technique that identifies and spatially resolves the chemical composition of a sample with a lateral resolution of less than 1 µm. Depth analyses can also be performed over thicknesses of several microns. In the case of a painting cross section, for example, TOF-SIMS can identify the organic composition, by detecting molecular ions and fragments of binders, as well as the mineral composition of most of the pigments. Importantly, the technique is almost not destructive and is therefore increasingly used in cultural heritage research such as the analysis of painting samples, especially old paintings. In this review, state of the art of TOF-SIMS analysis methods will be described with a particular focus on tuning the instruments for the analysis of painting cross sections and with several examples from the literature showing the added value of this technique when studying cultural heritage samples.

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