Optical filter wavefront distortion: out-of-band to in-band predictions and the effect of the illumination source bandwidth.

The wavefront distortion (WFD) of a surface with an optical filter coating is ideally measured at the operating wavelength (λ) and angle of incidence (θ) of the filter. However, this is not always possible, requiring that the filter be measured at an out-of-band wavelength and angle (typically λ=633n m and θ=0∘). Since the transmitted wavefront error (TWE) and reflected wavefront error (RWE) can depend on the measurement wavelength and angle, an out-of-band measurement may not give an accurate characterization of the WFD. In this paper, we will show how to predict the wavefront error (WFE) of an optical filter at the in-band wavelength and angle from a WFE measurement at an out-of-band wavelength and different angle. This method uses (i) the theoretical phase properties of the optical coating, (ii) the measured filter thickness uniformity, and (iii) the substrate's WFE dependence versus the angle of incidence. Reasonably good agreement was achieved between the RWE measured directly at λ=1050n m (θ=45∘) and the predicted RWE based on an RWE measurement at λ=660n m (θ=0∘). It is also shown through a series of TWE measurements using a light emitting diode (LED) and laser light sources that, if the TWE of a narrow bandpass filter (e.g., an 11 nm bandwidth centered at λ=1050n m) is measured with a broadband LED source, the WFD can be dominated by the chromatic aberration of the wavefront measuring system-hence, a light source that has a bandwidth narrower than the optical filter bandwidth should be used.

Effect of an optical coating on in-band and out-of-band transmitted and reflected wavefront error measurements.

The wavefront error (WE) of a surface with an optical coating ("filter") is ideally measured at the in-band wavelength of the filter. However, quite often this is not possible, requiring that the filter be measured at an out-of-band wavelength (typically 633 nm), assuming that the filter transmits (for transmitted WE, or TWE) or reflects (for reflected WE, or RWE) at this wavelength. This out-of-band TWE/RWE is generally assumed to provide a good estimation of the desired in-band TWE/RWE. It will be shown in this paper that this is not the case for a large class of filters (i.e., bandpass) where the group delay is significantly different at the in-band and out-of-band wavelengths and where the optical filter exhibits a thickness non-uniformity across the surface. A theoretical explanation will be given along with an approach to predict the in-band TWE/RWE based on the coating non-uniformity, the measured out-of-band TWE/RWE, and the theoretical properties of the optical filter at the in-band and out-of-band wavelengths. A reasonable agreement between theory and measurement was demonstrated by measuring the TWE of an 11 nm wide bandpass filter (centered at 1048 nm) at both in-band (λ=1048nm) and out-of-band (λ=625nm) wavelengths. A similar treatment is provided for RWE.

Multiresonant High-Q Plasmonic Metasurfaces.

Resonant metasurfaces are devices composed of nanostructured subwavelength scatterers that generate narrow optical resonances, enabling applications in filtering, nonlinear optics, and molecular fingerprinting. It is highly desirable for these applications to incorporate such devices with multiple high-quality-factor resonances; however, it can be challenging to obtain more than a pair of narrow resonances in a single plasmonic surface. Here, we demonstrate a multiresonant metasurface that operates by extending the functionality of surface lattice resonances, which are the collective responses of arrays of metallic nanoparticles. This device features a series of resonances with high-quality factors (Q ∼ 40), an order of magnitude larger than what is typically achievable with plasmonic nanoparticles, as well as a narrow free spectral range. This design methodology can be used to better tailor the transmission spectrum of resonant metasurfaces and represents an important step toward the miniaturization of optical devices.

Ultra-high-Q resonances in plasmonic metasurfaces.

Plasmonic nanostructures hold promise for the realization of ultra-thin sub-wavelength devices, reducing power operating thresholds and enabling nonlinear optical functionality in metasurfaces. However, this promise is substantially undercut by absorption introduced by resistive losses, causing the metasurface community to turn away from plasmonics in favour of alternative material platforms (e.g., dielectrics) that provide weaker field enhancement, but more tolerable losses. Here, we report a plasmonic metasurface with a quality-factor (Q-factor) of 2340 in the telecommunication C band by exploiting surface lattice resonances (SLRs), exceeding the record by an order of magnitude. Additionally, we show that SLRs retain many of the same benefits as localized plasmonic resonances, such as field enhancement and strong confinement of light along the metal surface. Our results demonstrate that SLRs provide an exciting and unexplored method to tailor incident light fields, and could pave the way to flexible wavelength-scale devices for any optical resonating application.