Tailored Langmuir-Schaefer Deposition of Few-Layer MoS2 Nanosheet Films for Electronic Applications.

Few-layer MoS2 films stay at the forefront of current research of two-dimensional materials. At present, continuous MoS2 films are prepared by chemical vapor deposition (CVD) techniques. Herein, we present a cost-effective fabrication of the large-area spatially uniform films of few-layer MoS2 flakes using a modified Langmuir-Schaefer technique. The compression of the liquid-phase exfoliated MoS2 flakes on the water subphase was used to form a continuous layer, which was subsequently transferred onto a submerged substrate by removing the subphase. After vacuum annealing, the electrical sheet resistance dropped to a level of 10 kΩ/sq, being highly competitive with that of CVD-deposited MoS2 nanosheet films. In addition, a consistent fabrication protocol of the large-area conductive MoS2 films was established. The morphology and electrical properties predetermine these films to advanced detecting, sensing, and catalytic applications. A large number of experimental techniques were used to characterize the exfoliated few-layer MoS2 flakes and to elucidate the formation of the few-layer MoS2 Langmuir film.

The effect of work function during electron spectroscopy measurements in Scanning Field-Emission Microscopy.

Electron spectroscopy proves to be a handy tool in material science. Combination of electron spectroscopy and scanning probe microscopy is possible through Scanning Field Emission Microscopy (SFEM), where a metallic probe positioned close to the surface is used as an electron source. However, using this not too much technologically demanding technique, it looks like the compromise between the lateral resolution and spectroscopic clarity must be considered. Here, we demonstrate, using experimental and simulation data, that the spectroscopic information can be understood without the need to grossly deteriorate the potential spatial resolution of the microscope. We prepared a three-section sample with clean W(110), sub-monolayer Cs on W(110) and monolayer of Cs on W(110) on which electron energy loss spectra are obtained via Scanning Probe Energy Loss Spectroscopy (SPELS) measurements. To explain the detected spectra a new model describing SPELS measurements in a SFEM is developed which aids to uncover the origin of spectral features typically detected during experiments. Experimental and simulation data are in a mutual agreement and observed spectral features on different surfaces could be explained. This novel understanding of SPELS can solve the main issue previously related to this technique, and good spatial resolution can be accompanied by the understanding of the measured spectra.