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1.
Opt Express ; 26(16): 21033-21043, 2018 Aug 06.
Artigo em Inglês | MEDLINE | ID: mdl-30119409

RESUMO

We present an approach for performing frequency domain diffuse optical spectroscopy (fd-DOS) utilizing a near-infrared tunable vertical cavity surface emitting laser (VCSEL) that enables high spectral resolution optical sensing in a miniature format. The tunable VCSEL, designed specifically for deep tissue imaging and sensing, utilizes an electrothermally tunable microelectromechanical systems topside mirror to tune the laser cavity resonance. At room temperature, the laser is tunable across 14nm from 769 to 782nm with single mode CW output and a peak output power of 1.3mW. We show that the tunable VCSEL is suitable for use in fd-DOS by measuring the optical properties of a tissue-simulating phantom over the tunable range. Optical properties were recovered within 0.0006mm-1 (absorption) and 0.09mm-1 (reduced scattering) compared to a broadband fd-DOS reference system. Our results indicate that tunable VCSELs may be an attractive choice to enable high spectral resolution optical sensing in a wearable format.

2.
Opt Express ; 16(25): 20388-94, 2008 Dec 08.
Artigo em Inglês | MEDLINE | ID: mdl-19065177

RESUMO

A novel fabrication process has been developed for fabricating undercut-etched electroabsorption modulators that are compatible with tunable lasers. This process allows for the incorporation of highly doped p-type InGaAs above the upper cladding as an ohmic contact layer. The EAM demonstrates significant improvement in the microwave performance with little effect on modulation efficiency due to the undercut etching. This device uses a traveling wave electrode design with an integrated, matched termination resistor to demonstrate a 34 GHz 3-dB bandwidth for a 600 microm long modulator.


Assuntos
Arsenicais/química , Desenho Assistido por Computador , Gálio/química , Índio/química , Lasers , Modelos Teóricos , Dispositivos Ópticos , Transdutores , Simulação por Computador , Eletrônica/instrumentação , Desenho de Equipamento , Análise de Falha de Equipamento , Luz , Espalhamento de Radiação
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