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1.
Opt Express ; 31(12): 19777-19793, 2023 Jun 05.
Artigo em Inglês | MEDLINE | ID: mdl-37381386

RESUMO

Ultrafast electron microbunch trains have broad applications in which the individual bunch length and the bunch-to-bunch interval are critical parameters that need to be precisely diagnosed. However, directly measuring these parameters remains challenging. This paper presents an all-optical method that simultaneously measures the individual bunch length and the bunch-to-bunch spacing through an orthogonal THz-driven streak camera. For a 3 MeV electron bunch train, the simulation indicates that the temporal resolution of individual bunch length and the bunch-to-bunch spacing is 2.5 fs and 1 fs, respectively. Through this method, we expect to open a new chapter in the temporal diagnostic of electron bunch trains.

2.
Rev Sci Instrum ; 78(4): 043305, 2007 Apr.
Artigo em Inglês | MEDLINE | ID: mdl-17477653

RESUMO

A new fast beam profile monitor has been developed at the Budker Institute of Nuclear Physics. This monitor is based on the Hamamatsu multianode photomultiplier with 16 anode strips and provides turn-by-turn measurement of the transverse beam profile. The device is equipped with an internal memory, which has enough capacity to store 131,072 samples of the beam profile. The dynamic range of the beam profile monitor allows us to study turn-by-turn beam dynamics within the bunch charge range from 1 pC up to 10 nC. Using this instrument, we have investigated at the VEPP-4M electron-positron collider a number of beam dynamics effects which cannot be observed by other beam diagnostics tools.

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