RESUMO
The underlying mechanisms of image distortions in atomic force microscopy (AFM) with CO-terminated tips are identified and studied in detail. AFM measurements of a partially fluorinated hydrocarbon molecule recorded with a CO-terminated tip are compared with state-of-the-art ab initio calculations. The hydrogenated and fluorinated carbon rings in the molecule appear different in size, which primarily originates from the different extents of their π-electrons. Further, tilting of the CO at the tip, induced by van der Waals forces, enlarges the apparent size of parts of the molecule by up to 50%. Moreover, the CO tilting in response to local Pauli repulsion causes a significant sharpening of the molecule bonds in AFM imaging.
RESUMO
Metal-organic complexes were formed by means of inelastic excitations in a scanning tunneling microscope (STM). The electronic structure of the complex was characterized using STM imaging and spectroscopy. By exploiting the symmetry of the complex, its electronic structure can be rationalized from linear combinations of molecular orbitals. The actual bonding geometry, which cannot be inferred from STM alone, was determined from atomic force microscopy images with atomic resolution. Our study demonstrates that the combination of these techniques enables a direct quantification of the interplay of geometry and electronic coupling in metal-organic complexes in real space.
RESUMO
We investigated dibenzo[a,h]thianthrene molecules adsorbed on ultrathin layers of NaCl using a combined low-temperature scanning tunneling and atomic force microscope. Two stable configurations exist corresponding to different isomers of free nonplanar molecules. By means of excitations from inelastic electron tunneling we can switch between both configurations. Atomic force microscopy with submolecular resolution allows unambiguous determination of the molecular geometry, and the pathway of the interconversion of the isomers. Our investigations also shed new light on contrast mechanisms in scanning tunneling microscopy.