Detalhe da pesquisa
1.
Chemical Identification of the Foremost Tip Atom in Atomic Force Microscopy.
Nano Lett
; 20(3): 2000-2004, 2020 Mar 11.
Artigo
em Inglês
| MEDLINE | ID: mdl-32031816
2.
Effects of Pb Intercalation on the Structural and Electronic Properties of Epitaxial Graphene on SiC.
Small
; 12(29): 3956-66, 2016 Aug.
Artigo
em Inglês
| MEDLINE | ID: mdl-27295020
3.
Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling Microscope.
ACS Nano
; 15(12): 19377-19386, 2021 Dec 28.
Artigo
em Inglês
| MEDLINE | ID: mdl-34780687
4.
Charging of electron beam irradiated amorphous carbon thin films at liquid nitrogen temperature.
Ultramicroscopy
; 196: 161-166, 2019 01.
Artigo
em Inglês
| MEDLINE | ID: mdl-30412841
5.
Electronegativity determination of individual surface atoms by atomic force microscopy.
Nat Commun
; 8: 15155, 2017 04 26.
Artigo
em Inglês
| MEDLINE | ID: mdl-28443645
6.
The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations.
Nanoscale
; 9(18): 5812-5821, 2017 May 11.
Artigo
em Inglês
| MEDLINE | ID: mdl-28225121
7.
(2n × 1) Reconstructions of TiO2(011) Revealed by Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy.
J Phys Chem C Nanomater Interfaces
; 118(40): 23168-23174, 2014 Oct 09.
Artigo
em Inglês
| MEDLINE | ID: mdl-25309642