RESUMO
Electroreflectance microscopy is demonstrated as a high-resolution, non-contact method to image dynamic charge distribution in integrated microsupercapacitor structures during fast voltage cycling. Electroreflectance camera images of a gold electrode H3PO4 polymer electrolyte microsupercapacitor reveal time varying charge distribution with submicron spatial resolution, millisecond time resolution, and electroreflectance resolution on the order of 500 nC cm(-2). A model describing changes in the metal electrode's optical constants as a function of free electron concentration shows good agreement with measured electroreflectance. The proposed method can be used for sensitive, non-contact measurements of charge spatial distribution, and defect and performance characterization in electrode-electrolyte microdevices.
RESUMO
This microsupercapacitor ageing study demonstrates the usefulness of the electroreflectance technique by quantifying local charge accumulation. Two separate devices with interdigitated electrodes were evaulated over a period of 4.1 million charge/discharge cycles. The key results are spatial mapping of charge accumulation in the gold electrodes derived from variation in the observed electrode reflectance. The nominal device exhibited little change in spatial distribution throughout the ageing cycle and serves as a comparison for the test device, which exhibited some nonuniform charge accumulation behavior. Further, an accelerated ageing test was completed by applying increasing voltage pulses up to 1.46 V to the device. Visual evidence of electrode ageing emerged in the reflectance distribution. An equivalent circuit model was developed to assess the evolution of individual circuit elements that correlate to the physical causes of ageing.