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1.
Opt Express ; 31(10): 16330-16347, 2023 May 08.
Artigo em Inglês | MEDLINE | ID: mdl-37157714

RESUMO

This work presents a mixed stitching interferometry method with correction from one-dimensional profile measurements. This method can correct the error of stitching angles among different subapertures using the relatively accurate one-dimensional profiles of the mirror, e.g., provided by the contact profilometer. The measurement accuracy is simulated and analyzed. The repeatability error is decreased by averaging multiple measurements of the one-dimensional profile and using multiple profiles at different measurement positions. Finally, the measurement result of an elliptical mirror is presented and compared with the global algorithm-based stitching, and the error of the original profiles is reduced to one-third. This result shows that this method can effectively suppress the accumulation of stitching angle errors in classic global algorithm-based stitching. The accuracy of this method can be further improved by using high-precision one-dimensional profile measurements such as the nanometer optical component measuring machine (NOM).

2.
Appl Opt ; 60(30): 9333-9341, 2021 Oct 20.
Artigo em Inglês | MEDLINE | ID: mdl-34807068

RESUMO

An off-axis rotation absolute measurement method by regarding random shift-rotation movement as off-axis rotation is proposed. The off-axis rotation center is calculated by matching feature points on the measured surface. Then the surface profile is calculated relying on Zernike polynomial fitting. Multiple rotations are carried out to reduce symmetrical and environment errors. N(N-1)/2 results can be collected after N times rotation. Compared to traditional methods, this method can obtain accurate results with high efficiency and does not need high precision positioning.

3.
Opt Express ; 26(23): 30724-30739, 2018 Nov 12.
Artigo em Inglês | MEDLINE | ID: mdl-30469965

RESUMO

Ultra-precision diamond machining is a promising technique for non-rotationally symmetrical surfaces with sub-micrometer form accuracy. The measurement and compensation processes in the fabrication process must be conducted carefully to achieve high form accuracy. However, significant challenges remain to improve the measurement accuracy and machining efficiency. Because of the remounting process, the off-machine measurements would reduce the efficiency. On the other hand, contact-type measurements can cause physical damage to some soft materials. To overcome these problems, a noncontact on-machine measurement (OMM) system is developed using two optical probes, and a two-step compensation strategy is proposed to generate a modified tool path. To verify the accuracy of the proposed measurement system, OMMs were performed on a spherical mirror using this system and were later compared with off-machine measurements. To evaluate the compensation strategy, an off-axis paraboloid mirror was diamond-machined and compensated using the proposed method. The results show that the OMM system and compensation strategy are effective for improving the form accuracy while simultaneously enhancing the machining efficiency.

4.
Appl Opt ; 57(7): B74-B82, 2018 Mar 01.
Artigo em Inglês | MEDLINE | ID: mdl-29521997

RESUMO

The nested grazing incidence telescope can achieve a large collecting area in x-ray astronomy, with a large number of closely packed, thin conical mirrors. Exploiting the surface metrological data, the ray tracing method used to reconstruct the shell surface topography and evaluate the imaging performance is a powerful tool to assist iterative improvement in the fabrication process. However, current two-dimensional (2D) ray tracing codes, especially when utilized with densely sampled surface shape data, may not provide sufficient accuracy of reconstruction and are computationally cumbersome. In particular, 2D ray tracing currently employed considers coplanar rays and thus simulates only these rays along the meridional plane. This captures axial figure errors but leaves other important errors, such as roundness errors, unaccounted for. We introduce a semianalytic, three-dimensional (3D) ray tracing approach for x-ray optics that overcomes these shortcomings. And the present method is both computationally fast and accurate. We first introduce the principles and the computational details of this 3D ray tracing method. Then the computer simulations of this approach compared to 2D ray tracing are demonstrated, using an ideal conic Wolter-I telescope for benchmarking. Finally, the present 3D ray tracing is used to evaluate the performance of a prototype x-ray telescope fabricated for the enhanced x-ray timing and polarization mission.

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