Pyrethroid Susceptibility in Field Populations of Picture-Winged Flies (Diptera: Ulidiidae) Infesting Fresh Market Sweet Corn in Florida.

Picture-winged flies (Diptera: Ulidiidae) are the most damaging insect pests of sweet corn (Zea mays L.) produced in Florida for the fresh market. Management of these pests, referred to as corn silk flies, relies on frequent pyrethroid applications targeting adults. In response to the need for an insecticide resistance management (IRM) program for corn silk flies in this highly intensive crop system, glass vial bioassays were conducted to determine the susceptibility of 12 corn silk fly populations to the pyrethroid beta-cyfluthrin. Two Euxesta eluta Loew and nine Euxesta stigmatias Loew populations were obtained by collecting infested ears in commercial and experimental fields in 2020 and 2021. One E. eluta laboratory colony was used as a susceptible reference population. The E. eluta reference colony was the most susceptible population, with an LC50 value of 0.01 µg/vial. The E. stigmatias field populations were generally less susceptible to beta-cyfluthrin than the E. eluta field populations, with the highest LC50 values attaining 3.51 µg/vial and 0.19 µg/vial, respectively. In addition, the five E. stigmatias populations from commercial sweet corn fields were as much as 17.6 times less susceptible than the four E. stigmatias populations from nontreated fields. Results suggest that E. stigmatias is less susceptible to pyrethroids than E. eluta. Results also suggest that corn silk flies in commercial sweet corn fields are selected for reduced pyrethroid susceptibility throughout the growing season. This study successfully used the glass vial bioassay method for corn silk flies, providing a new tool to initiate an IRM program.

Developmental Studies of Maize-Infesting Picture-Winged Flies (Diptera: Ulidiidae).

Eleven species of picture-winged flies (Diptera: Ulidiidae) attack maize (Zea mays L.) in the Americas. Field and laboratory studies were used to determine developmental times on sweet corn ears for the three most common species attacking the crop in the United States, Chaetopsis massyla (Walker), Euxesta eluta Loew, and Euxesta stigmatias Loew. Egg plus larval stage developmental times were evaluated in early Spring and late Fall 2009, and late Spring 2010, by placing newly deposited eggs in protected ears in the field. Newly formed puparia were removed daily from cages and held in the laboratory to determine pupal developmental times. Developmental times were compared with flies reared on artificial diet in the laboratory. Ear- and diet-reared adults were held until their death to determine adult longevity. Developmental times, including for pupae from ear-reared larvae, were significantly affected by species and season. All three species required nearly twice as long to complete development in the late Fall compared to late Spring studies. Flies required 3-13 d longer to complete development on artificial diet than on ears. Euxesta eluta adults lived two to three times longer than the other species, and females of all species lived 10-15% longer than males. Species and seasonal developmental times are discussed in relation to ear developmental times and control strategies. It is estimated that 16-19 generations per year of all three fly species can develop in the field in the sweet corn production area of southern Florida.