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Quantitative force versus distance measurements in amplitude modulation AFM: a novel force inversion technique.
Katan, Allard J; van Es, Maarten H; Oosterkamp, Tjerk H.
Afiliação
  • Katan AJ; Leiden Institute of Physics (LION), Leiden University, Niels Bohrweg 2, 2333 CA Leiden, The Netherlands.
Nanotechnology ; 20(16): 165703, 2009 Apr 22.
Article em En | MEDLINE | ID: mdl-19420576
ABSTRACT
A new method for extracting quantitative data from amplitude modulation dynamic force-distance measurements is developed. The method is based on the harmonic oscillator model of vibrating atomic force microscope cantilevers, and is capable of extracting both the conservative and dissipative parts of the tip-sample interaction from a measurement of oscillation amplitude and phase as a function of distance. Numerical simulations are used to demonstrate the validity of the method. Further proof of the accuracy of this method is provided by a measurement of electrostatic forces between an AFM tip and a graphite sample.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2009 Tipo de documento: Article País de afiliação: Holanda

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2009 Tipo de documento: Article País de afiliação: Holanda