Scanning tunneling microscopy and X-ray photoelectron spectroscopy studies of graphene films prepared by sonication-assisted dispersion.
ACS Nano
; 5(8): 6102-8, 2011 Aug 23.
Article
em En
| MEDLINE
| ID: mdl-21726071
ABSTRACT
We describe scanning tunneling microscopy and X-ray photoelectron spectroscopy studies of graphene films produced by sonication-assisted dispersion. Defects in these samples are not randomly distributed, and the graphene films exhibit a "patchwork" structure where unperturbed graphene areas are adjacent to heavily functionalized ones. Adjacent graphene layers are likely in poor mechanical contact due to adventitious species trapped between the carbon sheets of the sample.
Texto completo:
1
Base de dados:
MEDLINE
Assunto principal:
Sonicação
/
Microscopia de Tunelamento
/
Nanotecnologia
/
Espectroscopia Fotoeletrônica
/
Grafite
Idioma:
En
Revista:
ACS Nano
Ano de publicação:
2011
Tipo de documento:
Article
País de afiliação:
Estados Unidos