Method of excess fractions with application to absolute distance metrology: wavelength selection and the effects of common error sources.
Appl Opt
; 51(27): 6471-9, 2012 Sep 20.
Article
em En
| MEDLINE
| ID: mdl-23033015
ABSTRACT
Multiwavelength interferometry (MWI) is a well established technique in the field of optical metrology. Previously, we have reported a theoretical analysis of the method of excess fractions that describes the mutual dependence of unambiguous measurement range, reliability, and the measurement wavelengths. In this paper wavelength, selection strategies are introduced that are built on the theoretical description and maximize the reliability in the calculated fringe order for a given measurement range, number of wavelengths, and level of phase noise. Practical implementation issues for an MWI interferometer are analyzed theoretically. It is shown that dispersion compensation is best implemented by use of reference measurements around absolute zero in the interferometer. Furthermore, the effects of wavelength uncertainty allow the ultimate performance of an MWI interferometer to be estimated.
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Base de dados:
MEDLINE
Idioma:
En
Revista:
Appl Opt
Ano de publicação:
2012
Tipo de documento:
Article
País de afiliação:
Reino Unido