Transient-grating self-referenced spectral interferometry for infrared femtosecond pulse characterization.

ABSTRACT

We propose a technique for measuring infrared femtosecond pulses transient-grating self-referenced spectral interferometry. Based on this technique, we built an extremely simple, alignment-free device and successfully characterized both 38 fs pulses at 800 nm and sub-two-cycle 10 fs pulses at 1.75 µm.