Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm.
Opt Lett
; 38(22): 4723-6, 2013 Nov 15.
Article
em En
| MEDLINE
| ID: mdl-24322116
ABSTRACT
Structured illumination microscopy (SIM) is a powerful technique for obtaining super-resolved fluorescence maps of samples, but it is very sensitive to aberrations or misalignments affecting the excitation patterns. Here, we present a reconstruction algorithm that is able to process SIM data even if the illuminations are strongly distorted. The approach is an extension of the recent blind-SIM technique, which reconstructs simultaneously the sample and the excitation patterns without a priori information on the latter. Our algorithm was checked on synthetic and experimental data using distorted and nondistorted illuminations. The reconstructions were similar to that obtained by up-to-date SIM methods when the illuminations were periodic and remained artifact-free when the illuminations were strongly distorted.
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Base de dados:
MEDLINE
Assunto principal:
Algoritmos
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Iluminação
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Interpretação de Imagem Assistida por Computador
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Aumento da Imagem
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Artefatos
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Microscopia de Fluorescência
Tipo de estudo:
Prognostic_studies
Idioma:
En
Revista:
Opt Lett
Ano de publicação:
2013
Tipo de documento:
Article