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Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures.
Pielmeier, Florian; Meuer, Daniel; Schmid, Daniel; Strunk, Christoph; Giessibl, Franz J.
Afiliação
  • Pielmeier F; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Meuer D; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Schmid D; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Strunk C; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
  • Giessibl FJ; Institute of Experimental and Applied Physics, University of Regensburg, D-93053 Regensburg, Germany.
Beilstein J Nanotechnol ; 5: 407-12, 2014.
Article em En | MEDLINE | ID: mdl-24778967
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Beilstein J Nanotechnol Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Alemanha
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Beilstein J Nanotechnol Ano de publicação: 2014 Tipo de documento: Article País de afiliação: Alemanha