A high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure measurement.
Rev Sci Instrum
; 86(3): 034102, 2015 Mar.
Article
em En
| MEDLINE
| ID: mdl-25832248
ABSTRACT
We present the design and performance of a high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure (XAFS) spectra. The cell has a large fluorescence XAFS window (116 mm(Ï)) near the sample in the cell, realizing a large half-cone angle of 56°. We use a small heater (25 × 35 mm(2)) to heat the sample locally to 873 K. We measured a Pt-SnO2 thin layer on a Si substrate at reaction conditions having a high activity. In situ measurement enables the analysis of the difference XAFS spectra between before and during the reaction to reveal the structure change during the operation.
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Base de dados:
MEDLINE
Assunto principal:
Espectrometria por Raios X
Idioma:
En
Revista:
Rev Sci Instrum
Ano de publicação:
2015
Tipo de documento:
Article
País de afiliação:
Japão