Sampling variability in forensic likelihood-ratio computation: A simulation study.

Ali, Tauseef; Spreeuwers, Luuk; Veldhuis, Raymond; Meuwly, Didier

Ali, Tauseef; Spreeuwers, Luuk; Veldhuis, Raymond; Meuwly, Didier.

Afiliação

Ali T; Department of Electrical Engineering, Mathematics and Computer Science, University of Twente, 7500 AE, Enschede, The Netherlands. Electronic address: T.Ali@utwente.nl.
Spreeuwers L; Department of Electrical Engineering, Mathematics and Computer Science, University of Twente, 7500 AE, Enschede, The Netherlands. Electronic address: L.J.Spreeuwers@utwente.nl.
Veldhuis R; Department of Electrical Engineering, Mathematics and Computer Science, University of Twente, 7500 AE, Enschede, The Netherlands. Electronic address: R.N.J.Veldhuis@utwente.nl.
Meuwly D; Netherlands Forensic Institute, Laan van Ypenburg 6, 2497 GB, The Hague, The Netherlands. Electronic address: d.meuwly@nfi.minvenj.nl.

Sci Justice ; 55(6): 499-508, 2015 Dec.

Article em En | MEDLINE | ID: mdl-26654086

Assuntos

Funções Verossimilhança; Ciências Forenses; Humanos

Palavras-chave

Biometric recognition; Forensics; Likelihood-ratio; Sampling variability; Score

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Texto completo: 1 Base de dados: MEDLINE Assunto principal: Funções Verossimilhança Tipo de estudo: Prognostic_studies Limite: Humans Idioma: En Revista: Sci Justice Assunto da revista: JURISPRUDENCIA Ano de publicação: 2015 Tipo de documento: Article

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