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Recent charge-breeding developments with EBIS/T devices (invited).
Schwarz, S; Lapierre, A.
Afiliação
  • Schwarz S; National Superconducting Cyclotron Laboratory (NSCL), Michigan State University, East Lansing, Michigan 48824, USA.
  • Lapierre A; National Superconducting Cyclotron Laboratory (NSCL), Michigan State University, East Lansing, Michigan 48824, USA.
Rev Sci Instrum ; 87(2): 02A910, 2016 Feb.
Article em En | MEDLINE | ID: mdl-26931971
ABSTRACT
Short breeding times, narrow charge state distributions, low background, high efficiency, and the flexible time structure of the ejected low-emittance ion pulses are among the most attractive features of electron beam ion source or trap (EBIS/T) based charge breeders. Significant progress has been made to further improve these properties Several groups are working to increase current densities towards 10(3) or even 10(4) A/cm(2). These current densities will become necessary to deliver high charge states of heavy nuclei in a short time and/or provide sufficient space-charge capacity to handle high-current ion beams in next-generation rare-isotope beam (RIB) facilities. Efficient capture of continuous beams, attractive because of its potential of handling highest-current ion beams, has become possible with the development of high-density electron beams of >1 A. Requests for the time structure of the charge bred ion pulse range from ultra-short pulses to quasi-continuous beams. Progress is being made on both ends of this spectrum, by either dividing the extracted charge in many pulse-lets, adjusting the extraction potential for a near-uniform long pulse, or adding dedicated devices to spread the ion bunches delivered from the EBIS/T in time. Advances in EBIS/T charge state breeding are summarized, including recent results with NSCL's ReA EBIS/T charge breeder.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Rev Sci Instrum Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Estados Unidos