At-wavelength metrology facility for soft X-ray reflection optics.
Rev Sci Instrum
; 87(5): 052005, 2016 05.
Article
em En
| MEDLINE
| ID: mdl-27250385
ABSTRACT
A new Optics Beamline coupled to a versatile UHV reflectometer is successfully operating at BESSY-II. It is used to carry out at-wavelength characterization and calibration of in-house produced gratings and novel nano-optical devices as well as mirrors and multilayer systems in the UV and XUV spectral region. This paper presents most recent commissioning data of the beamline and shows their correlation with initial beamline design calculations. Special attention is paid to beamline key parameters which determine the quality of the measurements such as high-order suppression and stray light behavior. The facility is open to user operation.
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Base de dados:
MEDLINE
Idioma:
En
Revista:
Rev Sci Instrum
Ano de publicação:
2016
Tipo de documento:
Article
País de afiliação:
Alemanha