Can Point Defects in Surfaces in Solution be Atomically Resolved by Atomic Force Microscopy?

Reischl, Bernhard; Raiteri, Paolo; Gale, Julian D; Rohl, Andrew L

Reischl, Bernhard; Raiteri, Paolo; Gale, Julian D; Rohl, Andrew L.

Afiliação

Reischl B; Curtin Institute for Computation and Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845, Australia.
Raiteri P; Curtin Institute for Computation and Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845, Australia.
Gale JD; Curtin Institute for Computation and Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845, Australia.
Rohl AL; Curtin Institute for Computation and Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845, Australia.

Phys Rev Lett ; 117(22): 226101, 2016 Nov 25.

Article em En | MEDLINE | ID: mdl-27925727

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Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Austrália

Buscar no Google

Imprimir

XML

PubMed Links

Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Austrália