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Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries.
Stoffers, Andreas; Barthel, Juri; Liebscher, Christian H; Gault, Baptiste; Cojocaru-Mirédin, Oana; Scheu, Christina; Raabe, Dierk.
Afiliação
  • Stoffers A; 1Institute of Physics (IA),RWTH Aachen University,Otto-Blumenthal-Straße, 52074 Aachen,Germany.
  • Barthel J; 3Central Facility for Electron Microscopy,RWTH Aachen University,Ahornstraße 55, 52074 Aachen,Germany.
  • Liebscher CH; 2Max-Planck-Institut für Eisenforschung GmbH,Max-Planck-Straße 1, 40237 Düsseldorf,Germany.
  • Gault B; 2Max-Planck-Institut für Eisenforschung GmbH,Max-Planck-Straße 1, 40237 Düsseldorf,Germany.
  • Cojocaru-Mirédin O; 1Institute of Physics (IA),RWTH Aachen University,Otto-Blumenthal-Straße, 52074 Aachen,Germany.
  • Scheu C; 2Max-Planck-Institut für Eisenforschung GmbH,Max-Planck-Straße 1, 40237 Düsseldorf,Germany.
  • Raabe D; 2Max-Planck-Institut für Eisenforschung GmbH,Max-Planck-Straße 1, 40237 Düsseldorf,Germany.
Microsc Microanal ; 23(2): 291-299, 2017 04.
Article em En | MEDLINE | ID: mdl-28215198
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Alemanha
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Alemanha