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Probing the magnetic profile of diluted magnetic semiconductors using polarized neutron reflectivity.
Luo, X; Tseng, L T; Lee, W T; Tan, T T; Bao, N N; Liu, R; Ding, J; Li, S; Lauter, V; Yi, J B.
Afiliação
  • Luo X; School of Materials Science and Engineering, UNSW, Sydney, NSW, 2052, Australia.
  • Tseng LT; School of Materials Science and Engineering, UNSW, Sydney, NSW, 2052, Australia.
  • Lee WT; Bragg Institute, ANSTO, New Illawarra Road, Lucas Heights, NSW, 2234, Australia.
  • Tan TT; School of Materials Science and Engineering, UNSW, Sydney, NSW, 2052, Australia.
  • Bao NN; Department of Materials Science and Engineering, National University of Singapore, 119260, Singapore, Singapore.
  • Liu R; SIMS Facility, Office of the Deputy-Vice Chancellor (Research and Development), Western Sydney University, Locked Bag 1797, Penrith, New South Wales, 2751, Australia.
  • Ding J; Department of Materials Science and Engineering, National University of Singapore, 119260, Singapore, Singapore.
  • Li S; School of Materials Science and Engineering, UNSW, Sydney, NSW, 2052, Australia.
  • Lauter V; Quantum Condensed Matter Division, Neutron Sciences Directorate, Oak Ridge National Laboratory, Oak Ridge, Tennessee, 37831, USA.
  • Yi JB; School of Materials Science and Engineering, UNSW, Sydney, NSW, 2052, Australia. jiabao.yi@unsw.edu.au.
Sci Rep ; 7(1): 6341, 2017 07 24.
Article em En | MEDLINE | ID: mdl-28740239

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Austrália

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Austrália