Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements.

We present a newly designed compact and flexible soft X-ray spectrometer for resonant inelastic X-ray scattering (RIXS) studies within an energy range from 380 eV to 410 eV, which would include the K alpha emission lines of vital elements like nitrogen. We utilized an off-axis reflection zone plate (RZP) as the wavelength selective element with a maximum line density of 10000 l/mm. A higher energy resolution over a broader range of ± 15 eV around the designed energy was achieved by displacing the RZP. Additionally, for the first time, an actual optical side effect, the so-called comatic aberration was exploited to increase the energy resolution. First results show a resolving power in the order of 1300 for photon energy of 395 eV, which is comparable to a commercial varied line spacing grating (VLS).